The 575A digital IC testers built-in test library includes a broad range of TTL, CMOS, memory, LSI, interface and other IC devices of up to 40 pins.
The 575A digital IC testers built-in test library includes a broad range of TTL, CMOS, memory, LSI, interface and other IC devices of up to 40 pins.
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The Model 575A is able to locate intermittent and temperature related faults by using its unconditional or conditional loop testing modes. Unknown device identification is easily accomplished by selecting SEARCH from the menu, selecting the number of pins on the device and activating Search Mode. The 575A will search its library and identify the device, displaying possible functional equivalents for replacement. As part of the IC test, the specific IC number, the functional description of the device, and the status of faulty pins are scrolled through on the built-in display.
Features
Applications
| Batteries | 4 x 1.5V AA |
| DC Input | 6V, 850 mA max. regulated |
| Power Off | 10 μA |
| Standby | 30 mA |
| Test Thresholds | Variable, DAC Controlled |
| Batteries | 4 x 1.5V AA |
| DC Input | 6V, 850 mA max. regulated |
| Power Off | 10 μA |
| Standby | 30 mA |
| Test Thresholds | Variable, DAC Controlled |
